Seth Kosowsky's Home Page
Graduate student 9/88 - 8/95. Advisor P.S.
Pershan
Thesis title: X-ray scattering and the study of buried interfaces.
Topics studied:
- Structure of Si(001)/SiO2 interface
- Structure of Si(001)/SiO2/poly-Si buried interfaces
- Structure of Ge(001)/SiOx interface
- Smoothing and passivation of Si(001) by chemical etching
- Amorphous scattering from high pressure compressed fullerite
Publications :
- ``An X-ray Study of SiO$_{x}$/Si/Ge(001),'' S.D. Kosowsky,
C.-H. Hsu, P.S. Pershan, J. Bevk, B.S. Freer., to be published in
{\it App. Surf. Sci.} 84, 179 (1995).
- ``X-Ray Scattering Studies of SiO$_{x}$/Si/Ge(001),'' S.D. Kosowsky,
C.-H. Hsu, P.S. Pershan, J. Bevk, B.S. Freer. {\it Materials
Res. Soc. Symp. Proceedings}, vol. 326, 221 (1994).
- ``X-ray study of pressure collapsed fullerite,'' S.D. Kosowsky,
C.-H. Hsu, Nancy H. Chen, Fred Moshary, P.S. Pershan and Isaac F. Silvera.
{\it Phys. Rev. B } 48, 8474 (1993).
- ``X-ray specular-reflectivity study of the liquid-vapor density
profile of $^{4}$He," L. B.
Lurio, T.A. Rabedeau, P.S. Pershan, Isaac F. Silvera, M. Deutsch, S.D.
Kosowsky and B.M. Ocko. {\it Phys. Rev. B } 48, 9644 (1993).
- ``Liquid-Vapor Density Profile of Helium: An X-Ray Study," L. B.
Lurio, T.A. Rabedeau, P.S. Pershan, Isaac F. Silvera, M. Deutsch, S.D.
Kosowsky and B.M. Ocko. {\it Phys. Rev. Lett.} 68, 2628 (1992).
- ``X-ray grazing incidence diffraction from alkylsiloxane monolayers
on silicon wafers,'' I.M. Tidswell, T.A. Rabedeau, P.S. Pershan, S.D.
Kosowsky, J.P. Folkers and George M. Whitesides. {\it J. Chem. Phys.}
95, 2854 (1991).
- ``The Complete Wetting of a Surface,'' I.M. Tidswell,
T.A. Rabedeau, P.S. Pershan, S.D. Kosowsky, {\it Phys. Rev. Lett.}
66, 2108 (1991).
My resume
Current address:
Summit Technology
21 Hickory Drive
Waltham, MA 02154
tel: (617) 890-1234
fax: (617) 890-0313